Charge-injection mechanisms in semiconductor nanoparticles analyzed from force microscopy experiments
Résumé
Charge-injection and electric force microscopy experiments are performed in silicon nanoparticles deposited on a doped silicon substrate. We address in this paper the issue of the nanoparticle charging mechanisms. The nanoparticle charging is shown to occur in a regime of permanent current flow between the tip and substrate, during which the injected charge gets confined in the form of a two-dimensional electron gas at the nanoparticle-substrate interface. The equilibrium nanoparticle charge is calculated in a variational SchrödingerPoisson model in the effective mass approximation. The linearity of charge-voltage characteristics is discussed.
Domaines
Sciences de l'ingénieur [physics]
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