Charge-injection mechanisms in semiconductor nanoparticles analyzed from force microscopy experiments

Sophie Barbet (1, 2) , Thierry Melin (1, 2) , Heinrich Diesinger (1) , D. Deresmes (1) , Didier Stiévenard (1)

1 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
2 PHYSIQUE - IEMN - Physique - IEMN

Charge-injection and electric force microscopy experiments are performed in silicon nanoparticles deposited on a doped silicon substrate. We address in this paper the issue of the nanoparticle charging mechanisms. The nanoparticle charging is shown to occur in a regime of permanent current flow between the tip and substrate, during which the injected charge gets confined in the form of a two-dimensional electron gas at the nanoparticle-substrate interface. The equilibrium nanoparticle charge is calculated in a variational SchrödingerPoisson model in the effective mass approximation. The linearity of charge-voltage characteristics is discussed.

Domaines: Sciences de l'ingénieur [physics]

Sophie Barbet, Thierry Melin, Heinrich Diesinger, D. Deresmes, Didier Stiévenard. Charge-injection mechanisms in semiconductor nanoparticles analyzed from force microscopy experiments. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2006, 73, pp.045318. ⟨10.1103/PhysRevB.73.045318⟩. ⟨hal-00127820⟩