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Electric force microscopy of individually charged silicon nanoparticles

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https://hal.archives-ouvertes.fr/hal-00126439
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Submitted on : Thursday, January 25, 2007 - 9:23:29 AM
Last modification on : Wednesday, November 10, 2021 - 2:54:02 PM

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  • HAL Id : hal-00126439, version 1

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Thierry Melin, H. Diesinger, S. Barbet, D. Deresmes, T. Baron, et al.. Electric force microscopy of individually charged silicon nanoparticles. Materials Research Society 2005 Fall Meeting, 2005, Boston, MA, United States. ⟨hal-00126439⟩

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