Charging and emission effects of multiwalled carbon nanotubes probed by electric force microscopy

Mariusz Zdrojek (1) , Thierry Melin (2) , Christophe Boyaval (2) , D. Stievenard (2) , Benoit Jouault , Michał Woźniak (1) , Andrzej Huczko (1) , Wojciech Gȩbicki (1) , Leszek Adamowicz (1)

1 PW - Politechnika Warszawska
2 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520

Electrostatic properties of single-separated multiwalled carbon nanotubes (MWCNTs) deposited on a dielectric layer have been investigated by charge injection and electric force microscopy (EFM) experiments. We found that upon local injection from the biased EFM tip, charges delocalize over the whole nanotube length (i.e., 1-10 μm), consistent with a capacitive charging of the MWCNT-substrate capacitance. In addition, the insulating layer supporting the nanotubes is shown to act as a charge-sensitive plate for electrons emitted from the MWCNTs at low electric fields, thus allowing the spatial mapping of MWCNT field-emission patterns.

Mots clés: FIELD-EMISSION; FILMS

Domaines: Sciences de l'ingénieur [physics]

Mariusz Zdrojek, Thierry Melin, Christophe Boyaval, D. Stievenard, Benoit Jouault, et al.. Charging and emission effects of multiwalled carbon nanotubes probed by electric force microscopy. Applied Physics Letters, 2005, 86 (21), pp.213114-1-3. ⟨10.1063/1.1925782⟩. ⟨hal-00126235⟩