Skip to Main content Skip to Navigation
Journal articles

Truly quantitative XPS characterization of organic monolayers on silicon : study of alkyl and alkoxy monolayers on H-Si(111)

Document type :
Journal articles
Complete list of metadata

https://hal.archives-ouvertes.fr/hal-00125385
Contributor : Collection Iemn Connect in order to contact the contributor
Submitted on : Friday, January 19, 2007 - 11:40:58 AM
Last modification on : Saturday, October 9, 2021 - 3:18:39 AM

Identifiers

  • HAL Id : hal-00125385, version 1

Citation

X. Wallart, C. Henry de Villeneuve, P. Allongue. Truly quantitative XPS characterization of organic monolayers on silicon : study of alkyl and alkoxy monolayers on H-Si(111). Journal of the American Chemical Society, American Chemical Society, 2005, 127, pp.7871. ⟨hal-00125385⟩

Share

Metrics

Record views

104