Multi-granularity Metrics For The Era Of Strongly Personalized SOCs

Yannick Le Moullec (1) , Nader Ben Amor (1, 2) , Jean-Philippe Diguet (3) , Mohamed Abid (2) , Jean-Luc Philippe (3)

1 LESTER - Laboratoire d'Electronique des Systèmes TEmps Réel
2 CES - Computer, Electronics & Smart engineering systems design
3 Lab-STICC_UBS_CACS_MOCS

This paper details the first step of the Design Trotter framework for design space exploration applied to dedicated SOCs. The aim of this step is to provide metrics in order to guide the designer and the synthesis tool towards an efficient application architecture matching. This work presents a computation of metrics at all levels of the application graph-based hierarchy. These metrics are computed through data and control dependency analysis. They quantify the memory, control and processing orientations as well as the average of parallelism for different granularities.

Mots clés: Metrics; Design Space exploration; System Synthesis; ESL; CAD tool

Domaines: Architectures Matérielles [cs.AR]

Yannick Le Moullec, Nader Ben Amor, Jean-Philippe Diguet, Mohamed Abid, Jean-Luc Philippe. Multi-granularity Metrics For The Era Of Strongly Personalized SOCs. Jun 2003, 6 p. ⟨hal-00106232⟩