A spectral approach to estimate the INL of A/D converter

Jean-Marie Janik (1) , Vincent Fresnaud (2)

1 Equipe Image - Laboratoire GREYC - UMR6072
2 NXP Semiconductors

In this paper, a new method is presented to estimate the Integral Nonlinearity (INL) of an A/D converter. An analytical description of the INL influence combined with a Fast Fourier Transform of actual digitized sine wave allows one to obtain an accurate estimation while requiring small amount of acquired data compared to classical methods. The results are validated using simulations and experiments, and the method clearly showed relevant results when applied to actual A/D converter.

Mots clés: A/D converter; INL measurement; A/D converter testing; Fourier series; FFT testing

Domaines: Algorithme et structure de données [cs.DS]

Jean-Marie Janik, Vincent Fresnaud. A spectral approach to estimate the INL of A/D converter. Computers Standards & Interfaces, 2007, ADC Modelling and Testing, 29 (1), pp.31-37. ⟨10.1016/j.csi.2005.12.004⟩. ⟨hal-00092534⟩