An alternative scattering method to characterize surface roughness from transparent substrates

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https://hal.archives-ouvertes.fr/hal-00092525
Contributor : Laurent Gallais <>
Submitted on : Monday, September 11, 2006 - 1:40:36 PM
Last modification on : Monday, March 4, 2019 - 2:04:13 PM

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Myriam Zerrad, Carole Deumie, Michel Lequime, Claude Amra. An alternative scattering method to characterize surface roughness from transparent substrates. Optics Express, Optical Society of America, 2007, 15 (15), pp.9222-9231. ⟨hal-00092525⟩

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