Comparison between Spectral-based Methods for INL Estimation and feasibility of their implantation

Vincent Kerzérho (1, 2) , Serge Bernard (1) , Jean-Marie Janik (3) , Philippe Cauvet (2)

1 SysMIC - Conception et Test de Systèmes MICroélectroniques
2 Philips France Semiconducteurs
3 Equipe Image - Laboratoire GREYC - UMR6072

The Integral Non-Linearity (INL) is the most significant static parameter of Analog-to-Digital Converters. This paper presents a comparison between different INL test techniques based on INL estimation from the spectrum of the converted signal. Then, we investigate whether the most accurate technique is applicable in a realistic hardware configuration.

Mots clés: Fast Fourier Transform; Analog-to-Digital Converter testing; Integral Non-Linearity; polynomial fitting; Fourier series expansion

Domaines: Algorithme et structure de données [cs.DS]

Vincent Kerzérho, Serge Bernard, Jean-Marie Janik, Philippe Cauvet. Comparison between Spectral-based Methods for INL Estimation and feasibility of their implantation. IMSTW: International Mixed-Signals Testing Workshop, Jun 2005, Cannes, France. pp.270-275. ⟨hal-00092461⟩