Proceedings of 11th IEEE International On-Line Testing Symposium (IOLT 2005)Saint Raphael, French Riviera, France, July 6-8, 2005

M. Nicolaidis (1, 2) , Lorena Anghel (1)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 IROC TECHNOLOGIES - iROc Technologies

Issues related to on-line testing are increasingly important in modern electronics systems. In particular, the huge complexity of electronic systems has seen reliability needs growing up in various application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. Nanometer technologies impact adversely noise margins and make mandatory integrating on-line test in modern ICs. The Symposium is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in cryptographic chips.

Mots clés: On-line testing; Self-checking circuits; Fault-tolerant; fail-safe systems

Domaines: Micro et nanotechnologies/Microélectronique

M. Nicolaidis, Lorena Anghel. Proceedings of 11th IEEE International On-Line Testing Symposium (IOLT 2005)Saint Raphael, French Riviera, France, July 6-8, 2005. IEEE, 330 p., 2005. ⟨hal-00016849⟩