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Communication Dans Un Congrès Année : 1991

Coupling electron-beam probing with knowledge-based fault localization

Résumé

The authors deal with prototype validation of VLSI circuits. Circuits are observed using electron-beam probing used in voltage contrast mode, in such a way that gray-level images are obtained and processed in order to determine potential values of connexions. These values are compared against reference values, issued from fault-free simulation of the device under test. The list of discrepancies resulting from comparison constitutes input for a fault localization process done using a knowledge-based system. The reasons for the choice for such an approach are explained, and the approach itself is described, as well as its implementation and the obtained results.
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Dates et versions

hal-00007960 , version 1 (12-08-2005)

Identifiants

  • HAL Id : hal-00007960 , version 1

Citer

M. Marzouki, J. Laurent, B. Courtois. Coupling electron-beam probing with knowledge-based fault localization. 1991, pp.238-47. ⟨hal-00007960⟩

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