Raman microspectroscopic characterization of amorphous silica plastic behavior

Antoine Perriot (1) , Valérie Martinez (2) , Laurent Grosvalet (2) , Christine Martinet (2) , Bernard Champagnon (2) , Damien Vandembroucq (1) , Etienne Barthel (1)

1 SVI - Surface du Verre et Interfaces
2 LPCML - Laboratoire de Physico-Chimie des Matériaux Luminescents

Raman microspectroscopy was used to characterize amorphous silica plastic behavior. Using a correlation between Raman spectrum and density, a map of the local residual indentation-induced densification is obtained. The existence of a densification-induced hardening is also evidenced through a diamond anvil cell experiment. Such observations are not accounted for by the previously proposed hardening-free pressure-dependent yield criterion based on indentation curves. These results open the way to more accurate description of a constitutive law for amorphous silica.

Mots clés: raman; silica; plasticity

Domaines: Autre [cond-mat.other]

Antoine Perriot, Valérie Martinez, Laurent Grosvalet, Christine Martinet, Bernard Champagnon, et al.. Raman microspectroscopic characterization of amorphous silica plastic behavior. Journal of the American Ceramic Society, 2006, 89, pp.596. ⟨10.1111/j.1551-2916.2005.00747.x⟩. ⟨hal-00002965v2⟩