K. F. Heinrich, Electron Beam X-ray Microanalysis, 1981.

G. F. Bastin, H. J. Heijligers, and F. J. Van-loo, A Further Improvement in the Gaussian ??(??) Approach for Matrix Correction in Quantitative Electron Probe Microanalysis, Scanning, vol.14, issue.2, p.45, 1986.
DOI : 10.1002/sca.4950080204

I. Barkshire, P. Karduck, W. P. Rehbach, and S. Richter, High-Spatial-Resolution Low-Energy Electron Beam X-Ray Microanalysis, Mikrochimica Acta, vol.132, issue.2, p.113, 2000.
DOI : 10.1007/s006040050052

O. Arnould and F. Hild, Microscopy and Analysis, pp.13-25, 2000.

S. J. Reed, Electron Microprobe Analysis, 1975.