C. F. Binnig, C. Quate, and . Gerber, Atomic Force Microscope, Physical Review Letters, vol.56, issue.9, pp.930-933, 1986.
DOI : 10.1103/PhysRevLett.56.930

H. J. Rugar, R. Mamin, J. E. Erlandsson, and B. D. Stern, Force microscope using a fiber???optic displacement sensor, Review of Scientific Instruments, vol.59, issue.11, pp.2337-2340, 1988.
DOI : 10.1063/1.1139958

H. J. Rugar, P. Mamin, and . Guethner, Improved fiber???optic interferometer for atomic force microscopy, Applied Physics Letters, vol.55, issue.25, pp.2588-2590, 1989.
DOI : 10.1063/1.101987

S. F. Schonenberger and . Alvarado, A differential interferometer for force microscopy, Review of Scientific Instruments, vol.60, issue.10, pp.3131-3134, 1989.
DOI : 10.1063/1.1140543

J. Mulhern, T. Hubbard, C. S. Arnold, B. L. Blackford, and M. H. , A scanning force microscope with a fiber???optic???interferometer displacement sensor, Review of Scientific Instruments, vol.62, issue.5, pp.1280-1284, 1991.
DOI : 10.1063/1.1142485

G. Meyer, A. Nabil, and M. , Novel optical approach to atomic force microscopy, Applied Physics Letters, vol.53, issue.12, pp.1045-1047, 1988.
DOI : 10.1063/1.100061

J. Mamin and D. Rugar, Sub-attonewton force detection at millikelvin temperatures, Applied Physics Letters, vol.79, issue.20, pp.3358-3360, 2001.
DOI : 10.1063/1.1418256

W. Hoogenboom, P. Frederix, H. Fotiadis, A. Hug, and . Engel, Potential of interferometric cantilever detection and its application for SFM/AFM in liquids, Nanotechnology, vol.19, issue.38, p.384019, 2008.
DOI : 10.1088/0957-4484/19/38/384019

A. Jourdan, F. Lambrecht, J. Comin, and . Chevrier, Quantitative non-contact dynamic Casimir force measurements, EPL (Europhysics Letters), vol.85, issue.3, p.31001, 2009.
DOI : 10.1209/0295-5075/85/31001
URL : https://hal.archives-ouvertes.fr/hal-00195915

P. Paolino, B. Tiribilli, and L. Bellon, Direct measurement of spatial modes of a microcantilever from thermal noise, Journal of Applied Physics, vol.106, issue.9, p.94313, 2009.
DOI : 10.1063/1.3245394
URL : https://hal.archives-ouvertes.fr/ensl-00379365

P. Paolino and L. Bellon, Frequency dependence of viscous and viscoelastic dissipation in coated micro-cantilevers from noise measurement, Nanotechnology, vol.20, issue.40, p.405705, 2009.
DOI : 10.1088/0957-4484/20/40/405705
URL : https://hal.archives-ouvertes.fr/ensl-00362038

J. Buchoux, L. Bellon, S. Marsaudon, and J. Aimé, Carbon nanotubes adhesion and nanomechanical behavior from peeling force spectroscopy, The European Physical Journal B, vol.70, issue.1, pp.69-77, 2011.
DOI : 10.1140/epjb/e2011-20204-1
URL : https://hal.archives-ouvertes.fr/ensl-00547796

T. Li and L. Bellon, Dissipation of micro-cantilevers as a function of air pressure and metallic coating, EPL (Europhysics Letters), vol.98, issue.1, p.14004, 2012.
DOI : 10.1209/0295-5075/98/14004
URL : https://hal.archives-ouvertes.fr/ensl-00636839

J. Laurent, A. Steinberger, and L. Bellon, Functionalized AFM probes for force spectroscopy: eigenmode shapes and stiffness calibration through thermal noise measurements, Nanotechnology, vol.24, issue.22, p.225504, 2013.
DOI : 10.1088/0957-4484/24/22/225504

S. Bellon, H. Ciliberto, L. Boubaker, and . Guyon, Differential interferometry with a complex contrast, Optics Communications, vol.207, issue.1-6, pp.49-56, 2002.
DOI : 10.1016/S0030-4018(02)01475-X
URL : https://hal.archives-ouvertes.fr/ensl-00179781

L. Paolino and . Bellon, Optics Communication, pp.1-9, 2007.

P. Aguilar, L. Paolino, and . Bellon, Real-time single analog output in quadrature phase interferometry, 2013.

G. L. Gustafsson and J. Clarke, Scanning force microscope springs optimized for optical???beam deflection and with tips made by controlled fracture, Journal of Applied Physics, vol.76, issue.1, pp.172-181, 1994.
DOI : 10.1063/1.357124

A. Oral, R. A. Grimble, H. ¨. Ozer, and J. B. , High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy, Review of Scientific Instruments, vol.74, issue.8, pp.3656-3663, 2003.
DOI : 10.1063/1.1593786

S. Patil, G. Matei, H. Dong, P. M. Hoffmann, M. Karaköse et al., A highly sensitive atomic force microscope for linear measurements of molecular forces in liquids, Review of Scientific Instruments, vol.76, issue.10, p.103705, 2005.
DOI : 10.1063/1.2083147

C. Vogel, K. Mooser, R. J. Karrai, and . Warburton, Optically tunable mechanics of microlevers, Applied Physics Letters, vol.83, issue.7, pp.1337-1339, 2003.
DOI : 10.1063/1.1600513

C. Anselmetti, B. Gerber, H. Michel, H. Guntherodt, and . Rohrer, Compact, combined scanning tunneling/force microscope, Review of Scientific Instruments, vol.63, issue.5, pp.3003-3006, 1992.
DOI : 10.1063/1.1142600

J. Cunningham, S. T. Cheng, and W. W. Clegg, A differential interferometer for scanning force microscopy, Measurement Science and Technology, vol.5, issue.11, p.1350, 1994.
DOI : 10.1088/0957-0233/5/11/005

K. Goto, M. Sasaki, S. Okuma, and K. Hane, A double???focus lens interferometer for scanning force microscopy, Review of Scientific Instruments, vol.66, issue.5, pp.3182-3185, 1995.
DOI : 10.1063/1.1145548