Delay variation mapping induced by dynamic laser stimulation, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual., pp.305-311, 2005. ,
DOI : 10.1109/RELPHY.2005.1493103
URL : https://hal.archives-ouvertes.fr/hal-00401387
Expanding the scope of laser stimulation techniques for functional analysis and reliability of semiconductor devices by in-depth investigation of the optical interaction with the devices, 2010. ,
Improving defect localization techniques with laser beam with specific analysis and set-up modules, 2012 IEEE International Reliability Physics Symposium (IRPS) ,
DOI : 10.1109/IRPS.2012.6241903
URL : https://hal.archives-ouvertes.fr/hal-00988382