In situ break-junction sample holder for transmission electron microscopy

Santhana K. Eswara Moorthy (1) , Gerald Le Goff (2) , Michel Viret (2) , Mathieu K Kociak (1)

1 LPS - Laboratoire de Physique des Solides
2 LNO - Laboratoire Nano-Magnétisme et Oxydes

In this article, we report on the design and construction of an in situ break-junction sample holder for transmission electron microscopy. The holder is based on the differential-screw mechanism. The technical details and a comprehensive consideration to all relevant critical issues surrounding the instru-mentation procedure are presented. An application of the newly developed instrument is demonstrated using the example of a micro-scale gold wire. We also provide a detailed discussion on the challenges involved and the pitfalls to avoid in developing similar in situ holders.

Domaines: Physique [physics]

Santhana K. Eswara Moorthy, Gerald Le Goff, Michel Viret, Mathieu K Kociak. In situ break-junction sample holder for transmission electron microscopy. European Physical Journal: Applied Physics, 2013, 64, pp.31001. ⟨10.1051/epjap/2013130365⟩. ⟨cea-01498654⟩