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 Smart Integrated Electronic Systems

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MEMS Switches Clocks One bit acquisition Analytical models Computer architecture Advanced PMA STT-MRAM Thermal sensor Three-dimensional displays Bioimpedance spectroscopy Test cost reduction Integrated circuit noise Interconnects Magnetic tunneling Test CMOS Temperature distribution Noise Capacitors Integrated circuit design Integrated circuit interconnections BIST Secure IC Bandwidth Reliability Process variability Time-domain analysis Indirect testing ATE programming Competencies Electrothermal analysis Integrated circuit reliability Transistors Analog signals Ensemble methods RSA Phase shifter Brainstorming Integrated circuit modeling Low-cost measurements Specifications Circuit simulation ZigBee Low power Interconnect Through-silicon vias 3D Bioimpedance 3D integration Carbon nanotube Logic gates Calibration Analog/RF integrated circuits Alternate test Education Analog and RF integrated circuits Copper Security 1-bit acquisition RF integrated circuits SRAM Test efficiency Delays OQPSK Biosensor Circuit faults Phase noise Digital signal processing Power demand Circuits Microprocessors Evaluation COTS Test confidence RF test Analog/IF signals Design Fault tolerance Integrated circuit testing FDSOI technology Machine-learning algorithms Indirect test Power supplies Carbon nanotubes SEU Sensors Monitoring Integrated circuits Noise measurement Carbon nanotube interconnects CMOS memory circuits Digital ATE Built-In-Self-Test Carbon nanotube CNT Side-channel analysis Accelerometer Automatic test pattern generation Alternate testing Three-dimensional integrated circuits Circuit