High temperature electrical transport study of Si-doped AlN

Abstract : Electrical transport (resistivity and Hall Effect) have been studied in silicon doped aluminum nitride (AlN) thick epitaxial layers from 250 K up to 1000 K. The investigated samples, grown by molecular beam epitaxy were characterized by n-type conduction with an ambient temperature free carrier concentration of about ~ 1 x 10^15 cm^3. The donor level, situated about 250 meV below the conduction band edge, was found to be responsible for the experimentally observed increase of free carrier concentration with temperature. The temperature dependence of carrier mobility has been analyzed in the framework of a multimode scattering model. In the investigated samples the main scattering mechanism is supposed to be dislocation scattering.
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Superlattices and Microstructures, Elsevier, 2016, 98, pp.253-258. 〈10.1016/j.spmi.2016.08.038〉
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Contributeur : L2c Aigle <>
Soumis le : mardi 3 janvier 2017 - 13:34:19
Dernière modification le : jeudi 3 mai 2018 - 12:56:10

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Sylvie Contreras, Leszek Konczewicz, Jaweb Ben Messaoud, Herve Peyre, Mohamed Al Khalfioui, et al.. High temperature electrical transport study of Si-doped AlN. Superlattices and Microstructures, Elsevier, 2016, 98, pp.253-258. 〈10.1016/j.spmi.2016.08.038〉. 〈hal-01425146〉

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