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keyword_s : Ellipsometry

Ge-Sb-Te thin films deposited by pulsed laser: An ellipsometry and Raman scattering spectroscopy study

Petr Němec , Alain Moréac , Virginie Nazabal , Martin Pavlista , Jan Přikryl , et al.
Journal of Applied Physics, 2009, 106 (10), pp.103509 - 103509-7. ⟨10.1063/1.3259435⟩
Article dans une revue hal-00665512v1

First developments for photonics integrated on plasma-polymer-HMDSO: Single-mode TE00-TM00 straight waveguides

T. Begou , Bruno Bêche , Antoine Goullet , J.P. Landesman , Agnès A. Granier , et al.
Optical Materials, 2007, 30 (4), pp.657-661. ⟨10.1016/j.optmat.2007.02.049⟩
Article dans une revue istex hal-00389771v1

Structural and optical properties of AlGaP confinement layers and InGaAs quantum dot light emitters onto GaP substrate: Towards photonics on silicon applications

Cédric Robert Robert , Thanh Tra Nguyen , Antoine Létoublon , Mathieu Perrin , C. Cornet , et al.
Thin Solid Films, 2013, 541, pp.87-91
Article dans une revue hal-02050606v1

Structural and optical properties of AlGaP confinement layers and InGaAs quantum dots light emitters onto GaP substrate: towards photonics on silicon application

Cédric Robert Robert , Thanh Tra Nguyen , Mathieu Perrin , Charles Cornet , Antoine Létoublon , et al.
European Materials Research Society Spring Meeting 2012 (E-MRS Spring 2012), May 2012, Strasbourg, France. pp.87-91, ⟨10.1016/j.tsf.2012.10.134⟩
Communication dans un congrès istex hal-00918657v1