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Low frequency noise temperature measurements in SiGe:C heterojunction bipolar transistors

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https://hal.archives-ouvertes.fr/hal-01907425
Contributor : Dauverchain Eric Connect in order to contact the contributor
Submitted on : Monday, October 29, 2018 - 10:26:06 AM
Last modification on : Friday, October 22, 2021 - 2:47:18 PM

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  • HAL Id : hal-01907425, version 1

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M. Seif, F. Pascal, B. Sagnes, A. Hoffmann, S. Haendler, et al.. Low frequency noise temperature measurements in SiGe:C heterojunction bipolar transistors. 2015 International Conference on Noise and Fluctuations (ICNF), 2015, Xian, China. ⟨hal-01907425⟩

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