Low frequency noise temperature measurements in SiGe:C heterojunction bipolar transistors

M. Seif (1) , F. Pascal (1, 2) , B. Sagnes (1, 2) , A. Hoffmann (1, 2) , S. Haendler (3) , P. Chevalier (3) , D. Gloria (3)

1 IES - Institut d’Electronique et des Systèmes
2 M@CSEE - Micro électronique, Composants, Systèmes, Efficacité Energétique
3 ST-CROLLES - STMicroelectronics [Crolles]

Domaines: Electronique

M. Seif, F. Pascal, B. Sagnes, A. Hoffmann, S. Haendler, et al.. Low frequency noise temperature measurements in SiGe:C heterojunction bipolar transistors. 2015 International Conference on Noise and Fluctuations (ICNF), 2015, Xian, China. ⟨hal-01907425⟩