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The research laboratory "Group of Physics of Materials (GPM)" is a Joint Research Unit (UMR 6634) associated to University of Rouen Normandie, INSA of Rouen Normandie (both members of the federation of Normandy University) and affiliated to the French National Research Center (CNRS) as a member of the Institute of Physics (INP) and also of the Institute of Engineering and Systems Sciences (INSIS).

The laboratory has developed a strong expertise in scientific instrumentation and in material characterization down to the atomic scale, with a special emphasis on the connection between nanoscaled structures and properties.

The laboratory is organized in five Scientific Departments with an expertise internationally recognized in the following areas:



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Crystallization Clustering Interface Aluminum alloys Irradiation Reliability Atom Probe Tomography GaN Microstructure Aging Mechanical properties Ion implantation Field emission Spark plasma sintering Magnesium Grain boundary Nanostructures Atom probe tomography APT Thermodynamics Kinetics Aluminium alloys Boron Magnetism Ion irradiation Diffusion Precipitation Multilayers Simulation Monte Carlo Modélisation FeCr High pressure torsion High temperature Spinodal decomposition Fe-Cr Fast scanning calorimetry Segregation Finite elements Intermetallics Exchange bias Décomposition spinodale Severe plastic deformation Composition Glass transition Hardness Simulation Steels Steel Copper Fatigue Sonde atomique tomographique Phase separation Numerical simulation Grain boundaries Poster Size effects Microelectronics Modeling Thin films A Thermoplastic resin Field evaporation Monte Carlo simulations Three-dimensional atom probe Grains ultrafins Conf Austenite Nanostructure Couches minces Sonde atomique APT Implantation ionique Phase transformation TEM Carbon Carbides Phase transformations Atom probe Ferrite Laser atom probe tomography Iron Cyclic loading Corrosion resistance Magnetic multilayers Précipitation Photoluminescence Monte Carlo simulation Martensite D Mechanical testing Phase transition Ageing Semiconductors Modelling Mechanical testing Atom probe tomography Nanocomposite Transmission electron microscopy Atom-probe tomography Fiabilité Défauts ponctuels Thermoplastic Dislocations




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Lab HAL referee

M. Etienne TALBOT