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Article Dans Une Revue Physical Review Letters Année : 2011

Electronic Structure Investigation of Highly Compressed Aluminum with K Edge Absorption Spectroscopy

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The electronic structure evolution of highly compressed aluminum has been investigated using timeresolved $K$ edge x-ray absorption spectroscopy. A long laser pulse (500 ps, I$_L$ $\approx$ 8 X 10$^{13}$ W/cm$^2$) wasused to create a uniform shock. A second ps pulse (I$_L$ $\approx$ 10$^{17}$ W/cm$^2$) generated an ultrashort broadbandx-ray source near the Al $K$ edge. The main target was designed to probe aluminum at reshocked conditionsup to now unexplored (3 times the solid density and temperatures around 8 eV). The hydrodynamicalconditions were obtained using rear side visible diagnostics. Data were compared to ${ab}$ ${initio}$ and denseplasma calculations, indicating potential improvements in either description. This comparison shows thatx-ray-absorption near-edge structure measurements provide a unique capability to probe matter at theseextreme conditions and severally constrains theoretical approaches currently used.
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hal-01561859 , version 1 (17-12-2017)

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A. Benuzzi-Mounaix, F. Dorchies, V. Recoules, F. Festa, O. Peyrusse, et al.. Electronic Structure Investigation of Highly Compressed Aluminum with K Edge Absorption Spectroscopy. Physical Review Letters, 2011, 107, pp.165006. ⟨10.1103/PhysRevLett.107.165006⟩. ⟨hal-01561859⟩
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