Electronic Structure Investigation of Highly Compressed Aluminum with K Edge Absorption Spectroscopy
Résumé
The electronic structure evolution of highly compressed aluminum has been investigated using timeresolved $K$ edge x-ray absorption spectroscopy. A long laser pulse (500 ps, I$_L$ $\approx$ 8 X 10$^{13}$ W/cm$^2$) wasused to create a uniform shock. A second ps pulse (I$_L$ $\approx$ 10$^{17}$ W/cm$^2$) generated an ultrashort broadbandx-ray source near the Al $K$ edge. The main target was designed to probe aluminum at reshocked conditionsup to now unexplored (3 times the solid density and temperatures around 8 eV). The hydrodynamicalconditions were obtained using rear side visible diagnostics. Data were compared to ${ab}$ ${initio}$ and denseplasma calculations, indicating potential improvements in either description. This comparison shows thatx-ray-absorption near-edge structure measurements provide a unique capability to probe matter at theseextreme conditions and severally constrains theoretical approaches currently used.
Domaines
Physique [physics]
Origine : Fichiers produits par l'(les) auteur(s)
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