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International Conference on Pattern Recognition 2002, Québec City : Canada (2002)
A robust semi-supervised EM-based clustering algorithm with a reject option
Christophe Saint-Jean 1, Carl Frélicot 1
(2002-08-11)

In this paper, we address the problem of semi-supervision in the framework of parametric clustering by using labeled and unlabeled data together. Clustering algorithms can take advantage from few labeled instances in order to tune parameters, improve convergence and overcome local extrema due to bad initialization. We extend a robust parametric clustering algorithm able to manage outlier rejection to the semi-supervision approach. This is achieved by modifying the Expectation-Maximization algorithm. The proposed method shows good performance with respect to data structure discovering, even facing to outliers.
1:  Laboratoire Informatique, Image et Interaction (L3I)
Université de La Rochelle : EA2118
Computer Science/Signal and Image Processing

Engineering Sciences/Signal and Image processing
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