| HAL: hal-00082428, version 1 |
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| Annual meeting of SPIE, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, San Diego : États-Unis (2003) |
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| Photothermal microscopy and laser damage in optical components |
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| Mireille Commandre 1Jean-Yves Natoli 1 |
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| (2003) |
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| 1: | Institut FRESNEL (IF) |
| CNRS : UMR6133 – Université de Provence - Aix-Marseille I – Université Paul Cézanne - Aix-Marseille III – Ecole Centrale de Marseille | |
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| Subject | : | Physics/Physics/Optics |
| hal-00082428, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00082428 | |
| oai:hal.archives-ouvertes.fr:hal-00082428 | |
| From: Laurent Gallais | |
| Submitted on: Tuesday, 27 June 2006 16:44:07 | |
| Updated on: Tuesday, 27 June 2006 16:44:07 | |