| Type de publication : |
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Communications avec actes |
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| Domaine : |
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Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique
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| Titre : |
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Variability-Speed-Consumption Trade-off in Near Threshold Operation |
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| Auteur(s) : |
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Mariem Slimani ( ) 1, Fernando Silveira ( ) 2, Philippe Matherat ( ) 1 |
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| Laboratoire : |
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| Résumé : |
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Sub-threshold operation is an efficient solution for ultra low power applications. However, it is very sensitive to process variability which can impact the robustness and effective performance of the circuit. On the other hand this sensitivity decreases as we move towards near-threshold operation. In this paper, the impact of variability on sub-threshold and near-threshold circuit performance is investigated through analytical modeling and circuit simulation in a 65 nm industrial low power CMOS process. We show that variability moves the effective minimum energy point towards the near threshold region. Thus, we demonstrate that when variability is taken into account, a complete model that includes the near threshold (moderate inversion) region is necessary in order to correctly model circuit performance around the minimum energy point. Finally, we present the resulting speed-consumption trade-off in a variability-aware analysis of sub-threshold and near-threshold operation. |
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Langue du texte intégral : |
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Anglais |
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| Titre de l'ouvrage : |
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Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation |
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| Audience : |
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internationale |
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| Date de publication : |
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28/09/2011 |
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| Volume : |
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6951 |
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| Page, identifiant, ... : |
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308--316 |
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| Éditeur scientifique : |
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Springer Berlin / Heidelberg |
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| Série/Collection : |
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Lecture Notes in Computer Science |
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| Titre de la conférence : |
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PATMOS 2011 |
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| Date de la conférence : |
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26/09/2011 |
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| Date de la conférence (fin) : |
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29/09/2011 |
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| Ville : |
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Madrid |
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| Pays : |
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Espagne |
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| Mots Clés : |
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Sub-threshold logic – Near-threshold operation – Variability – Modeling |
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| Commentaire : |
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The original publication is available at www.springer.com |
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