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| HAL : in2p3-00658332, version 1 |
| DOI : 10.1016/j.nimb.2011.12.047 |
| Fiche détaillée |  Récupérer au format |
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| Nuclear Instruments and Methods in Physics Research Research Section B: Beam Interactions with Materials and Atoms 277 (2012) 14-17 |
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| Response of cubic zirconia irradiated with 4-MeV Au ions at high temperature: an X-ray diffraction study |
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| A. Debelle 1L. Thomé 1 |
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| (15/04/2012) |
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| Yttria-stabilized cubic zirconia single-crystals have been irradiated with 4-MeV Au2+ ions at fluences ranging from 1012 cm-2 to 2x1015 cm-2 and at three temperatures (room temperature, 500°C and 800°C). Evaluation of the irradiation-induced strain has been performed by the X-ray diffraction technique. It is found that, whatever the irradiation temperature, the elastic-strain build-up exhibits two steps. An increase of the (tensile) strain-level is observed in the first step. A drastic strain relaxation occurs at a transition fluence, which defines the beginning of the second step. Increasing the irradiation temperature induces a decrease of the strain level and a shift of the transition fluence towards low fluence. Both effects may be explained by an enhanced defect-clustering rate which occurs already at 500°C. |
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| 1 : | Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM) |
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CNRS : UMR8609 – IN2P3 – Université Paris XI - Paris Sud |
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| 2 : | Science des Procédés Céramiques et de Traitements de Surface (SPCTS) |
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Université de Limoges – Ecole Nationale Supérieure de Céramique Industrielle – Institut des Procédés Appliqués aux Matériaux – CNRS : UMR7315 |
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| Axe 3 : organisation structurale multiéchelle des matériaux CSNSM PCI |
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| Thème(s) | : | Physique/Matière Condensée/Science des matériaux Sciences de l'ingénieur/Matériaux |
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| Ion irradiation – Strain – YSZ – Temperature – XRD |
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| in2p3-00658332, version 1 | |
| http://hal.in2p3.fr/in2p3-00658332 | |
| oai:hal.in2p3.fr:in2p3-00658332 | |
| Contributeur : Christine Hadrossek | |
| Soumis le : Mardi 10 Janvier 2012, 11:47:06 | |
| Dernière modification le : Mercredi 30 Mai 2012, 13:36:48 | |
