 |
 |
 |
 |
|
|
|
|
| HAL : hal-00211893, version 1 |
| DOI : 10.1063/1.2721843 |
| Fiche détaillée |  Récupérer au format |
 |
| Applied Physics Letters 90 (2007) 152905-1-152905-3 |
|
|
|
|
| Piezoforce microscopy study of lead-free perovskite Na0.5Bi0.5TiO3 thin films |
|
|
| Fabien Remondiere 1, 2A. Wu 3 |
|
|
| (2007) |
|
|
|
| As a promising lead-free ferroelectric material, Na0.5Bi0.5TiO3 NBT was synthesized as thin films via a classic 2-methoxyethanol sol-gel route and chemical solution deposition method. Perovskite structure with random orientation of crystallites has been obtained on platinized silicon wafer at low temperature 460 °C. Piezoelectric activity in such films was detected using electrical analysis. X-ray diffraction and piezoresponse force microscopy PFM have been used to analyze NBT thin films with different microstructures and properties dependent on fabrication and annealing processes. |
|
|
|
|
|
|
|
|
|
|
|
| 1 : | Electronic Ceramics Department |
|
|
|
Institut Jozef Stefan |
|
|
| 2 : | Science des Procédés Céramiques et de Traitements de Surface (SPCTS) |
|
|
|
CNRS : UMR6638 – Université de Limoges – Ecole Nationale Supérieure de Céramique Industrielle – Institut des Procédés Appliqués aux Matériaux |
|
|
| 3 : | Center for Research in Ceramic and Composite Materials (CICECO) |
|
|
|
University of Aveiro |
|
|
|
|
|
|
|
|
|
| Axe 3 : organisation structurale multiéchelle des matériaux |
|
|
|
|
|
|
| Scanning force microscopy – Electrical properties |
|
| hal-00211893, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00211893 | |
| oai:hal.archives-ouvertes.fr:hal-00211893 | |
| Contributeur : Martine Segear | |
| Soumis le : Mardi 22 Janvier 2008, 10:46:02 | |
| Dernière modification le : Mardi 7 Octobre 2008, 14:51:46 | |
