| HAL : hal-00328461, version 1 |
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| IEEE Transactions on Nuclear Science 53, 4 (2006) 1890-1896 |
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| Analysis of Quasi-Monoenergetic Neutron and Proton SEU Cross Sections for Terrestrial Applications |
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| D. Lambert 1J. Baggio 2, 3 |
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| (2006) |
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| This paper investigates the single event upset sensitivity of Bulk SRAMs for terrestrial applications. The technology sensitivity is analyzed with both quasi-monoenergetic neutron and proton experiments in an energy range from 14 to 180 MeV. Analytical and simulation based correction methods of the neutron cross section are presented and validated. Then, neutron and proton cross section are compared. Soft Error Rate (for the terrestrial neutron spectrum) calculated with either proton or quasi-monoenergetic neutron data are also presented and compared |
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| 1 : | Laboratoire d'aérologie (LA) |
| CNRS : UMR5560 – Observatoire Midi-Pyrénées – INSU – Université Paul Sabatier [UPS] - Toulouse III | |
| 2 : | Département de Conception et Réalisation des Experimentations, CEA-DIF (DCRE CEA) |
| CEA | |
| 3 : | DAM Île-de-France (DAM/DIF) |
| CEA : DAM/DIF | |
| 4 : | ONERA Département de l'Environnement SPatial (ONERA/DESP) |
| ONERA | |
| 5 : | Institut d'Electronique du Sud (IES) |
| CNRS : UMR5214 – Université Montpellier II - Sciences et techniques | |
| 6 : | EADS, Corporate Research Center |
| EADS Paris | |
| 7 : | Space Transportat |
| European Aeronaut Def & Space Co | |
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| Domaine | : | Sciences de l'ingénieur/Electronique |
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| Bulk technologies – neutron and proton effects – soft error rate (SER) – single-event upset (SEU) |
| hal-00328461, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00328461 | |
| oai:hal.archives-ouvertes.fr:hal-00328461 | |
| Contributeur : Dauverchain Eric | |
| Soumis le : Vendredi 10 Octobre 2008, 10:00:38 | |
| Dernière modification le : Jeudi 30 Octobre 2008, 14:01:18 | |