46 articles – 578 Notices  [english version]
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fulltext access Faraday optical isolator in the 9.2 µm range for QCL applications
Hilico L., Douillet A., Karr J.-P., Tournie E.
Rapport de recherche (2011) 1 [hal-00574660 - version 1]
Continuous-wave scanning terahertz near-field microscope
Guillet J.-P., Chusseau L., Adam R., Grosjean T., Penarier A., Baida F.I., Charraut D.
Microwave and Optical Technology Letters 53, 3 (2011) 580-582 [hal-00565014 - version 1]
Noise Equivalent Pressure of a 1550 nm fiber laser as an underwater acoustic sensor dedicated to high depth
Orsal B., Ouarets S., Vacher R., Dureisseix D.
Dans Proceedings of the 21st International Conference on Noise and Fluctuations - ICNF 2011 - 21st International Conference on Noise and Fluctuations - ICNF 2011, Canada (2011) [hal-00805526 - version 1]
Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron Sensor
Dilillo L., Bosio A., Rech P., Girard P., Wrobel F., Saigné F.
IEEE International Workshop on Advances in Sensors and Interfaces, Italy (2011) [lirmm-00805394 - version 1]
Dynamic-Stress Neutrons Test of Commercial SRAMs
Rech P., Galliere J.-M., Girard P., Wrobel F., Saigne F., Dilillo L.
IEEE Nuclear and Space Radiation Effects Conference, United States (2012) [lirmm-00805349 - version 1]
Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power Devices
Griffoni A., Van Duivenbode J., Linten D., Simoen E., Rech P., Dilillo L., Wrobel F., Verbist P., Groeseneken G.
RADECS'2011: European Conference on Radiation and Its Effects on Components and Systems, Espagne (2011) [lirmm-00805339 - version 1]
Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays
Rech P., Galliere J.-M., Girard P., Griffoni A., Wrobel F., Saigne F., Dilillo L.
RADECS'2012: European Conference on Radiation and Its Effects on Components and Systems, Espagne (2011) [lirmm-00805314 - version 1]
Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench
Dilillo L., Rech P., Galliere J.-M., Girard P., Wrobel F., Saigne F.
IEEE Latin American test Workshop, Brésil (2011) [lirmm-00805120 - version 1]
fulltext access Nanomechanical Characterisation of the Wood Cell Wall Using Atomic Force Microscopy
Arnould O., Bytebier K., Cabrolier P., Arinero R.
Dans Actes du colloque MECAMAT Aussois 2011 - MECAMAT Aussois 2011, France (2011) [hal-00689525 - version 1]
Table ronde : Comparaison des systèmes d'enseignement du Québec et de la France : les formations d'ingénieurs en France
Bonnaud O., Despaux G.
Dans 9ème Colloque sur l'Enseignement des Technologies et des Sciences de l'Information et des Systèmes CETSIS - 9ème Colloque sur l'Enseignement des Technologies et des Sciences de l'Information et des Systèmes CETSIS, Canada (2011) [hal-00658618 - version 1]