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Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode Tsiligiannis G., Dilillo L., Bosio A., Girard P., Todri A., Virazel A., Mcclure S. S., Touboul A. D., Wrobel F., Saigne F. IEEE Transaction on Nuclear Science Issue 99 (2013) 1-6 [lirmm-00805005 - version 1]

Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell Wrobel F., Touboul A. D., Dilillo L., Saigne F. IEEE Transactions on Nuclear Science, 99 (2013) 1-5 [lirmm-00805001 - version 1]

SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations Tsiligiannis G., Vatajelu I. Elena, Dilillo L., Bosio A., Girard P., Pravossoudovitch S., Todri A., Virazel A., Wrobel F., Saigne F. IOLTS'2013: 19th IEEE International On-Line Testing Symposium, Grèce (2013) [lirmm-00818955 - version 1]

Temperature Impact on the Neutron SER of a Commercial 90nm SRAM Tsiligiannis G., Dilillo L., Bosio A., Girard P., Pravossoudovitch S., Todri A., Virazel A., Frost C., Wrobel F., Saigne F. NSREC 2013: IEEE Nuclear and Space Radiation Effects Conference, United States (2013) [lirmm-00805291 - version 1]

Oxide-confined mid-infrared VCSELs Laaroussi Y., Sanchez D., Cerutti L., Levallois C., Paranthoën C., Rumeau A., Tourte C., Almuneau G. Electronics Letters 48, 25 (2012) 1616-1618 [hal-00788447 - version 1]

Wood elastic characterization from a single sample by resonant ultrasound spectroscopy Longo R., Delaunay T., Laux D., El Mouridi M., Arnould O., Le Clezio E. Ultrasonics 52 (2012) 971-974 [hal-00742901 - version 1]

Terahertz emission induced by optical beating in nanometer-length field-effect transistors Nouvel P., Torres J., Blin S., Marinchio H., Palermo C., Varani L., P. S., Starikov Y., Gruzinskis V., Teppe F. et al Journal of Applied Physics 111 (2012) 103707 [hal-00699894 - version 1]

Embedded silicon detector to investigate the natural radiative environment Pantel D., Vaillé J.-R., Wrobel F., Dilillo L., Galliere J.-M., Autran J.-L., Cocquerez P., Chadoutaud P., Saigne F. Journal of Instrumentation, 5 (2012) 1-11 [lirmm-00805011 - version 1]

Full elastic caracterization of wood materials by Resonant Ultrasound Spectroscopy Delaunay T., Laux D., Arnould O., Almeras T. Acoustics 2012, France (2012) [hal-00719100 - version 1]

Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress Rech P., Galliere J.-M., Girard P., Griffoni A., Boch J., Wrobel F., Saigne F., Dilillo L. IEEE Transaction on Nuclear Science 59, 4 (2012) 893-899 [lirmm-00805031 - version 1]