 |
|
| HAL: hal-00328264, version 1 |
| Detailed view |  Export this paper |
 |
| IEEE Transactions on Nuclear Science 53, 4 (2006) 1897-1901 |
|
|
|
|
| Charge Sharing Study in the Case of Neutron Induced SEU on 130 nm Bulk SRAM Modeled by 3-D Device Simulation |
|
|
| T. Mérelle 1S. Serre |
|
|
| (2006) |
|
|
|
| The charge sharing quantification in the case of neutron induced SEUs in a 130 nm bulk SRAM is presented. Conclusions on its contribution to the soft errors sensitivity evaluation using Monte-Carlo codes are underlined |
|
|
|
|
|
|
|
|
|
|
|
| 1: | Institut d'Electronique du Sud (IES) |
|
|
|
CNRS : UMR5214 – Université Montpellier II - Sciences et techniques |
|
|
| 2: | ST Microelectronics (ST Microelectronics, Crolles) |
|
|
|
ST microelectronics |
|
|
| 3: | STMicroelectronics (Crolles) (ST-CROLLES) |
|
|
|
STMicroelectronics |
|
|
| 4: | EADS, Corporate Research Center |
|
|
|
EADS Paris |
|
|
| 5: | Space Transportat |
|
|
|
European Aeronaut Def & Space Co |
|
|
|
|
|
|
|
|
|
| Subject | : | Engineering Sciences/Electronics |
|
|
| Bulk – charge sharing – diffusion – neutron – SEU – SRAM – TCAD simulations |
|
| hal-00328264, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00328264 | |
| oai:hal.archives-ouvertes.fr:hal-00328264 | |
| From: Dauverchain Eric | |
| Submitted on: Friday, 10 October 2008 08:48:21 | |
| Updated on: Wednesday, 22 October 2008 10:13:36 | |
