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| HAL: hal-00327149, version 1 |
| DOI: 10.1109/TNS.2007.910171 |
| Detailed view |  Export this paper |
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| IEEE Transactions on Nuclear Science 54, 6 (2007) 2272-2275 |
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| Study of the thermal behavior of the OSL integrated sensor response |
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| P. Garcia 1J.-R. Vaillé 1 |
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| (2007-12) |
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| Temperature irradiation is shown to cause the fading of the OSL signal. The temperature dependence is modeled using an Arrhenius law. A simple method is proposed to correct this effect a posteriori. |
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| 1: | Institut d'Electronique du Sud (IES) |
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CNRS : UMR5214 – Université Montpellier II - Sciences et techniques |
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| 2: | Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA) |
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CNRS : UMR5159 – Université Joseph Fourier - Grenoble I – Institut National Polytechnique de Grenoble (INPG) |
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| Subject | : | Engineering Sciences/Electronics |
| hal-00327149, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00327149 | |
| oai:hal.archives-ouvertes.fr:hal-00327149 | |
| From: Dauverchain Eric | |
| Submitted on: Tuesday, 7 October 2008 15:06:38 | |
| Updated on: Thursday, 9 October 2008 09:23:56 | |
