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2178 articles – 2572 references
[version française]
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Croissance et caractérisation électrique de nanocristaux d'InAs/SiO2 pour des applications de mémoires non volatiles sur silicium.
Hocevar M.
INSA de Lyon (14/10/2008), Abdelkader Souifi, Michel Gendry (Dir.) [tel-00551840 - version 1]