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| HAL : jpa-00225927, version 1 |
| DOI : 10.1051/jphyscol:1986734 |
| Fiche détaillée |  Récupérer au format |
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| Journal de Physique Colloques 47, C7 (1986) C7-189-C7-194 |
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| ATOM PROBE ANALYSIS OF PASSIVE FILMS ON IRON |
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| G. BauerM. Leisch |
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| (1986) |
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| Depth profiling analysis was performed for passive oxide films grown on pure iron specimens to determine the composition of the films and the interface regions. The thickness of the films as a function of applied potential and time of passivation was determined in order to get information on the kinetics of oxide growth. Benzotriazole commonly used as a corrosion inhibitor was added to the buffer solution to act as a tracer in the investigation of the mechanism of oxide growth. |
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| Domaine | : | Physique/Articles anciens |
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| jpa-00225927, version 1 | |
| http://hal.archives-ouvertes.fr/jpa-00225927 | |
| oai:hal.archives-ouvertes.fr:jpa-00225927 | |
| Contributeur : Archives Journal de Physique | |
| Soumis le : Mercredi 1 Janvier 1986, 08:00:00 | |
| Dernière modification le : Mercredi 1 Janvier 1986, 08:00:00 | |
