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| HAL: jpa-00225923, version 1 |
| DOI: 10.1051/jphyscol:1986730 |
| Detailed view |  Export this paper |
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| Journal de Physique Colloques 47, C7 (1986) C7-165-C7-168 |
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| THE MEASUREMENTS OF SURFACE MIGRATION ACTIVATION ENERGY FOR EDGE POSITIONED ATOMS OF TUNGSTEN (011) PLANE |
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| Z. StepienJ. Kukulka |
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| (1986) |
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| The activation energy on the removal and self-diffusion process of edge atoms of the top [011] oriented tungsten field emitter has been determined on the basis of the cyclic field emission current changes observed after the successive, short duration annealing of emitter. The consideration both the processes surface migration towards the base of emitter and so called "patch-field" effect permits to obtain the activation energy Qe = 1.3 ± 0.2 eV and preexponential factor Ae of the order of 107 s-1 from measurements in the effective temperatures range 1135 - 1290 K. |
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| Subject | : | Physics/Physics archives |
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| jpa-00225923, version 1 | |
| http://hal.archives-ouvertes.fr/jpa-00225923 | |
| oai:hal.archives-ouvertes.fr:jpa-00225923 | |
| From: Archives Journal de Physique | |
| Submitted on: Wednesday, 1 January 1986 08:00:00 | |
| Updated on: Wednesday, 1 January 1986 08:00:00 | |
