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| HAL: jpa-00225915, version 1 |
| DOI: 10.1051/jphyscol:1986722 |
| Detailed view |  Export this paper |
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| Journal de Physique Colloques 47, C7 (1986) C7-121-C7-126 |
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| ANALYSIS OF FIELD EMITTER SURFACES BY VERY HIGH RESOLUTION AUGER ELECTRON SPECTROSCOPY |
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| M. MundschauR. Vanselow |
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| (1986) |
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| Impurity segregation on Pt was studied using very high resolution Auger electron spectroscopy analysis of annealed field emitter surfaces. Using elemental analysis obtained from the Auger studies to complement information obtained from field emission microscopy studies, the lateral distribution of segregated surface impurities was determined at the sub-micron level. |
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| Subject | : | Physics/Physics archives |
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| jpa-00225915, version 1 | |
| http://hal.archives-ouvertes.fr/jpa-00225915 | |
| oai:hal.archives-ouvertes.fr:jpa-00225915 | |
| From: Archives Journal de Physique | |
| Submitted on: Wednesday, 1 January 1986 08:00:00 | |
| Updated on: Wednesday, 1 January 1986 08:00:00 | |
