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| HAL : jpa-00225915, version 1 |
| DOI : 10.1051/jphyscol:1986722 |
| Fiche détaillée |  Récupérer au format |
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| Journal de Physique Colloques 47, C7 (1986) C7-121-C7-126 |
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| ANALYSIS OF FIELD EMITTER SURFACES BY VERY HIGH RESOLUTION AUGER ELECTRON SPECTROSCOPY |
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| M. MundschauR. Vanselow |
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| (1986) |
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| Impurity segregation on Pt was studied using very high resolution Auger electron spectroscopy analysis of annealed field emitter surfaces. Using elemental analysis obtained from the Auger studies to complement information obtained from field emission microscopy studies, the lateral distribution of segregated surface impurities was determined at the sub-micron level. |
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| Domaine | : | Physique/Articles anciens |
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| jpa-00225915, version 1 | |
| http://hal.archives-ouvertes.fr/jpa-00225915 | |
| oai:hal.archives-ouvertes.fr:jpa-00225915 | |
| Contributeur : Archives Journal de Physique | |
| Soumis le : Mercredi 1 Janvier 1986, 08:00:00 | |
| Dernière modification le : Mercredi 1 Janvier 1986, 08:00:00 | |
