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| HAL : inria-00072150, version 1 |
| Voir la fiche détaillée |  BibTeX,EndNote,... |
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| Fault isolation for diagnosis: nuisance rejection and multiple hypotheses testing |
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| Michèle Basseville 1Igor V. Nikiforov 2 |
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| (2002) |
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| Fault detection, fault isolation and fault diagnosis are addressed within a statistical framework. The corresponding inference problems are stated. Several statistical tools for solving these inference problems are described. Particular emphasis is put on dealing with nuisance parameters and deciding between multiple hypotheses. How to use these tools for solving problems is discussed. An example illustrates some of the proposed methods. |
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| 1 : | SIGMA2 (INRIA - IRISA) |
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CNRS : UMR6074 – INRIA – INSA Rennes – Université de Rennes 1 |
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| 2 : | Laboratoire Modélisation et Sûreté des Systèmes (LM2S) |
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Université de Technologie de Troyes |
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| Domaine | : | Informatique/Autre |
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| HYPOTHESES TESTING / NUISANCE PARAMETERS / MULTIPLE HYPOTHESES / FAULT ISOLATION AND DIAGNOSIS |
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| inria-00072150, version 1 | |
| http://hal.inria.fr/inria-00072150 | |
| oai:hal.inria.fr:inria-00072150 | |
| Contributeur : Rapport De Recherche Inria | |
| Soumis le : Mardi 23 Mai 2006, 19:54:55 | |
| Dernière modification le : Vendredi 5 Janvier 2007, 11:51:47 | |
