Transient-TLP (T-TLP): a simple method for accurate ESD protection transient behavior measurement

David Trémouilles (1) , Antoine Delmas (2) , Nicolas Mauran (3) , Nicolas Nolhier (4) , Houssam Arbess (1) , Marise Bafleur (4)

1 LAAS-ISGE - Équipe Intégration de Systèmes de Gestion de l'Énergie
2 Freescale Semiconducteurs
3 LAAS-I2C - Service Instrumentation Conception Caractérisation
4 LAAS-ESE - Équipe Énergie et Systèmes Embarqués

Understanding the transient behavior of ESD protection devices is a key to optimize IC protection solutions. However, outside of the ESD world, electrical characterization of pulsed electrical signal involving both kilowatts of power and extreme frequency bandwidth (DC to several GHz) is definitely not common. Dedicated and specific measurement methodologies are thus required. In this work, we proposed a new and simple method that allows accurate triggering behavior measurements based on a standard very-fast TLP setup, which does not compromise on any performance aspects (bandwidth, maximum current, single-pulse, simplicity...) and does not require any additional or external characterization equipment.

Mots clés: ESD characterization; transient TLP; overshoot

Domaines: Micro et nanotechnologies/Microélectronique

David Trémouilles, Antoine Delmas, Nicolas Mauran, Nicolas Nolhier, Houssam Arbess, et al.. Transient-TLP (T-TLP): a simple method for accurate ESD protection transient behavior measurement. EOS/ESD Symposium, Sep 2013, LAS VEGAS, United States. pp.258-267. ⟨hal-01056511⟩