Open-Thru de-embedding for Graphene RF devices

Giancarlo Vincenzi (1) , Georgios Deligeorgis (1) , Fabio Coccetti (1) , Patrick Pons (1)

1 LAAS - Laboratoire d'analyse et d'architecture des systèmes

The performances of graphene RF devices rely heavily on the precision of the de-embedding techniques adopted, and the small size of the lines increase variability issues in the RF standards and test devices. In this work, a robust and high precision de-embedding technique adapted to the needs of microwave graphene devices is presented. Two standards and only one step after SOLT calibration are needed.

Mots clés: Calibration; frequency measurements; graphene; integrated circuit modeling; thin films

Domaines: Micro et nanotechnologies/Microélectronique

Giancarlo Vincenzi, Georgios Deligeorgis, Fabio Coccetti, Patrick Pons. Open-Thru de-embedding for Graphene RF devices. International Microwave Symposium (IMS), Jun 2014, Tampa Bay, Florida, United States. pp.Proceedings IMS. ⟨hal-01024248⟩