A systematic study of the impact of geometry on the low frequency noise in patterned La0.7Sr0.3MnO3 thin films at 300 K - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2009

A systematic study of the impact of geometry on the low frequency noise in patterned La0.7Sr0.3MnO3 thin films at 300 K

Résumé

We report systematic measurements of low frequency noise performed at room temperature in La0.7Sr0.3MnO3 (LSMO) thin films (thickness =150 nm) patterned with different lengths (50mm to 300mm) and widths (20mm to 400mm). Noise measurements were performed using two probe configuration, four probe configuration and even six probe configuration. Different 1/f noise contributions were observed for the film, for the current contacts and also for the voltage contacts. For the smallest devices, the noise spectral density of the film contribution does not follow the classical quadratic dependence with the DC voltage. The current contact contribution is due to current crowding at the metal/LSMO interface as already reported. The voltage contact contribution could be attributed to DC current circulation into the voltage contacts.
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Dates et versions

hal-00974727 , version 1 (10-04-2014)

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  • HAL Id : hal-00974727 , version 1

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Sheng Wu, Bruno Guillet, Laurence Méchin, Jean-Marc Routoure. A systematic study of the impact of geometry on the low frequency noise in patterned La0.7Sr0.3MnO3 thin films at 300 K. AIP Conference Proceedings,20th International Conference on Noise and Fluctuations, 2009, Pisa, Italy. p.125-128. ⟨hal-00974727⟩
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