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Communication Dans Un Congrès Année : 2013

Temperature, Back Gate and Polarization Studies in Nanotransistor based THz plasma detectors

Résumé

Nanometer size field effect transistors can operate as efficient resonant or broadband terahertz detectors, mixers, phase shifters and frequency multipliers at frequencies far beyond their fundamental cut-of frequency. This work is an overview of some recent results concerning the THz detection by Si MOS transistors with back-gate, low temperatures operation, and circular polarization studies of nanometer scale field effect transistors for the detection of terahertz radiation. Also first results on graphene transistors are discussed.
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Dates et versions

hal-00955621 , version 1 (04-03-2014)

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Wojciech Knap, Dmytro But, M. Bawedin, S. Chang, Oleg Klimenko, et al.. Temperature, Back Gate and Polarization Studies in Nanotransistor based THz plasma detectors. 21st International Conference on Applied Electromagnetics and Communications ICECom, Oct 2013, Dubrovnik, Croatia. pp.1 - 6, ⟨10.1109/ICECom.2013.6684747⟩. ⟨hal-00955621⟩
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