Toward a reliability analysis method of wide band gap power electronic components and modules

Guillaume Parent (1, 2) , Gregor Massiot (2) , Vincent Rouet (2) , Catherine Munier (2) , Paul-Etienne Vidal (1) , Francisco Carrillo (1)

1 LGP - Laboratoire Génie de Production
2 EADS IW - EADS Innovation Works [Suresnes]

This study is addressing on the reliability of COTS (Commercial Off-The-Shelf) power electronic components and modules which could be used in high reliability systems such as aerospace systems. This paper details the first followed steps to achieve a reliability assessment of some COTS power devices. These first steps are: -Construction analyses for the determination of the packaging assembly technologies of COTS power devices; -Discussion on the material used in COTS power devices; -Synthesis of the potential failure risk analysis under harsh environments; -Determination of several accelerated ageing tests to check the potential failure modes and mechanisms in power electronic for aerospace systems

Mots clés: Reliability; COTS; Power electronic components and modules; Construction analyses; Assembly technology

Domaines: Micro et nanotechnologies/Microélectronique

Guillaume Parent, Gregor Massiot, Vincent Rouet, Catherine Munier, Paul-Etienne Vidal, et al.. Toward a reliability analysis method of wide band gap power electronic components and modules. IMAPS-Europe European Microelectronics and Packaging Conference EMPC, Sep 2013, Grenoble, France. ⟨hal-00952709⟩