Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project

Sonia Ben Dhia (1) , Alexandre Boyer (2)

1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués
2 LAAS - Laboratoire d'analyse et d'architecture des systèmes

This paper presents the scientific achievements of EMRIC project that aimed at developing a new research activity which mixes EMC and IC reliability. This project contributes to improve the electromagnetic robustness (EMR) of integrated circuits over the full life-time of the electronic system, with a special emphasis on deep submicron technology. The results of this project give a unique overview about EMR in the scientific community and will contribute to develop EMR qualification procedures, EMR design techniques and EMR predictive methods.

Mots clés: EMC; aging; Integrated circuits

Domaines: Electronique

Sonia Ben Dhia, Alexandre Boyer. Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project. Microelectronics Reliability, 2013, 53, pp.1266-1272. ⟨10.1016/j.microrel.2013.08.016⟩. ⟨hal-00938353⟩