The conducted immunity of SPI EEPROM memories

Mohamed Amellal (1) , Mohamed Ramdani (1) , Richard Perdriau (1) , Mathieu Médina (2) , M'Hamed Drissi (3) , Ali Ahaitouf (4)

1 ESEO-EMC
2 Serma Technologies
3 IETR - Institut d'Électronique et des Technologies du numéRique
4 LSSC - Laboratoire Signaux Systèmes et Composants

This paper focus on the conducted immunity measurement of non-volatile memories up to 1 GHz. A specific measurement flow is introduced, which makes possible to compare the EMC performances in different test cases. Trough measurements and simulation, this study gives a real view on the immunity difference of this integrated circuits (IC).

Mots clés: EEPROM electromagnetic compatibility integrated circuit manufacture Immunity measurement

Domaines: Electronique; Electromagnétisme

Mohamed Amellal, Mohamed Ramdani, Richard Perdriau, Mathieu Médina, M'Hamed Drissi, et al.. The conducted immunity of SPI EEPROM memories. Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on, Sep 2013, Brugge, Belgium. pp.926 - 930. ⟨hal-00924246⟩