Spectroscopic Measurement of Interlayer Screening in Multilayer Epitaxial Graphene - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Physical Review Letters Année : 2010

Spectroscopic Measurement of Interlayer Screening in Multilayer Epitaxial Graphene

Résumé

The substrate-induced charge-density profile in carbon face epitaxial graphene is determined using nondegenerate ultrafast midinfrared pump-probe spectroscopy. Distinct zero crossings in the differential transmission spectra are used to identify the Fermi levels of layers within the multilayer stack. Probing within the transmission window of the SiC substrate, we find the Fermi levels of the first four heavily doped layers to be, respectively, 360, 215, 140, and 93 meV above the Dirac point. The charge screening length is determined to be one graphene layer, in good agreement with theoretical predictions.
Fichier principal
Vignette du fichier
SunPRL10_Screening.pdf (519.6 Ko) Télécharger le fichier
Origine : Fichiers éditeurs autorisés sur une archive ouverte
Loading...

Dates et versions

hal-00911815 , version 1 (30-11-2013)

Identifiants

Citer

Dong Sun, Charles Divin, Claire Berger, Walt A. de Heer, Philip N. First, et al.. Spectroscopic Measurement of Interlayer Screening in Multilayer Epitaxial Graphene. Physical Review Letters, 2010, 104 (13), pp.136802. ⟨10.1103/PhysRevLett.104.136802⟩. ⟨hal-00911815⟩

Collections

UGA CNRS NEEL
296 Consultations
270 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More