A Binomial Model for Radiated Immunity Measurements - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue IEEE Transactions on Electromagnetic Compatibility Année : 2013

A Binomial Model for Radiated Immunity Measurements

Résumé

We propose a statistical analysis of immunity testing in EMC based on binomial distributions. This approach aims at extracting the immunity properties of a device from its probability of failure during a test. We show that under certain conditions, this approach can be applied to plane wave testing environments and reverberation chambers. This approach allows one to control the uncertainty of the immunity level estimation and to reduce the duration of a test by both reducing significantly the number of observations needed to reach a given uncertainty budget and giving an optimal number of power level tested. We show the benefits of such an approach for immunity testing and we present some experimental results.
Fichier principal
Vignette du fichier
article_proof.pdf (2.14 Mo) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-00850451 , version 1 (06-08-2013)

Identifiants

Citer

Emmanuel Amador, Krauthäuser Hans Georg, Philippe Besnier. A Binomial Model for Radiated Immunity Measurements. IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (4), pp.683-691. ⟨10.1109/TEMC.2012.2231942⟩. ⟨hal-00850451⟩
399 Consultations
766 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More