Growth and characterization of ferrite film prepared by pulsed laser deposition

S. N. Kane (1) , M. Satalkar (1) , A. Ghosh (1) , D. M. Phase (2) , R. J. Chaudhary (2) , Alexandre Pasko (3) , Martino Lobue (3) , Frederic Mazaleyrat (3)

1 School of Physics
2 UGC-DAE Consortium for Scientific Research
3 SATIE-MME - Matériaux Magnétiques pour l'Energie

Ba2Fe12O19 (BaO.6Fe2O3) films have been grown on (0001) sapphire substrate using pulsed laser deposition (PLD) technique. Prepared films were characterized by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), X-ray reflectivity (XRR), atomic force microscopy (AFM) and magnetic measurements. XRD confirms the formation of Ba2Fe12O19 phase, whereas presence of Fe2O3 was also identified. X-ray photoelectron spectroscopy (XPS) shows the signature of all the elements present in the barium ferrite. XRR data show the thickness of the film is ~ 24.2 nm with top layer roughness of ~ 3.7 nm. AFM measurement suggests the formation of clusters with average roughness of ~ 3.9 nm. Magnetic measurements of the target reveal its anisotropic nature with coercivity values: 0.23 and 0.24 T, obtained along two orthogonal directions. For the prepared thin film, the obtained coercivity ~ 80 mT and saturation induction 0.13 T are lower than the usual values obtained for Ba2Fe12O19 compound (coercivity and saturation induction values are 0.19 Tesla and 0.48 T respectively), can be ascribed to the presence of Fe2O3 phase.

Domaines: Science des matériaux [cond-mat.mtrl-sci]

S. N. Kane, M. Satalkar, A. Ghosh, D. M. Phase, R. J. Chaudhary, et al.. Growth and characterization of ferrite film prepared by pulsed laser deposition. Journal of Physics: Conference Series, 2012, 365 (1), pp.012023. ⟨10.1088/1742-6596/365/1/012023⟩. ⟨hal-00827727⟩