Automatic Stress Effects Computation Based On A Layout Generation Tool For Analog IC

Stéphanie Youssef (1) , Damien Dupuis (1) , Ramy Iskander (1) , Marie-Minerve Louërat (1)

1 CIAN - Circuits Intégrés Numériques et Analogiques

This paper studies the matching and the stress effect problems that appear in deep submicron CMOS technologies. These effects significantly affect the electrical behavior of CMOS transistors. We propose a method to compute stress effect parameters resulting from different layout styles such as interdigitated and symmetrical styles. We apply this method to a transistor device and a differential pair device. We also quantify the errors due to transistor folding and stress effects in 65nm CMOS technology for different device layouts. The results show the effectiveness of the proposed method.

Domaines: Micro et nanotechnologies/Microélectronique

Stéphanie Youssef, Damien Dupuis, Ramy Iskander, Marie-Minerve Louërat. Automatic Stress Effects Computation Based On A Layout Generation Tool For Analog IC. 2010 IEEE International Behavioral Modeling and Simulation Conference (BMAS 2010), Sep 2010, San Jose, CA, United States. pp.7-12, ⟨10.1109/BMAS.2010.6156590⟩. ⟨hal-00749921⟩