A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device

Thomas Quaglio (1) , Franck Dahlem , Sylvain Martin (1) , Anne Gérardin (2) , Clemens Winkelmann (1) , Hervé Courtois (1)

1 NEEL - QuNES - Nano-Electronique Quantique et Spectroscopie
2 NEEL - Cryo - Cryogénie

We present a combined scanning force and tunneling microscope working in a dilution refrigerator that is optimized for the study of individual electronic nano-devices. This apparatus is equipped with commercial piezo-electric positioners enabling the displacement of a sample below the probe over several hundred microns at very low temperature, without excessive heating. Atomic force microscopy based on a tuning fork resonator probe is used for cryogenic precise alignment of the tip with an individual device. We demonstrate the local tunneling spectroscopy of a hybrid Josephson junction as a function of its current bias.

Domaines: Supraconductivité [cond-mat.supr-con]

Thomas Quaglio, Franck Dahlem, Sylvain Martin, Anne Gérardin, Clemens Winkelmann, et al.. A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device. Review of Scientific Instruments, 2012, 83 (12), pp.123702. ⟨10.1063/1.4769258⟩. ⟨hal-00734939⟩